Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.30 Transistors>17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
Sponsored link
immediate downloadReleased: 2017-11-30
17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

17/30366375 DC

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

Format
Availability
Price and currency
English Secure PDF
Immediate download
24.20 EUR
English Hardcopy
In stock
24.20 EUR
Standard number:17/30366375 DC
Pages:16
Released:2017-11-30
Status:Draft for Comment
DESCRIPTION

17/30366375 DC


This standard 17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) is classified in these ICS categories:
  • 31.080.30 Transistors

Print