Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>18/30375624 DC BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
Sponsored link
immediate downloadReleased: 2018-07-13
18/30375624 DC BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

18/30375624 DC

BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

Format
Availability
Price and currency
English Secure PDF
Immediate download
24.20 EUR
English Hardcopy
In stock
24.20 EUR
Standard number:18/30375624 DC
Pages:39
Released:2018-07-13
Status:Draft for Comment
DESCRIPTION

18/30375624 DC


This standard 18/30375624 DC BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

Print