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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.30 Transistors>18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

18/30381548 DC

BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

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Standard number:18/30381548 DC
Pages:17
Released:2018-08-03
Status:Draft for Comment
DESCRIPTION

18/30381548 DC


This standard 18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) is classified in these ICS categories:
  • 31.080.30 Transistors

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