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immediate downloadReleased: 2020-04-01
20/30406234 DC
BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test method for bipolar degradation by body diode operating
CURRENCY
Standard number: | 20/30406234 DC |
Pages: | 11 |
Released: | 2020-04-01 |
Status: | Draft for Comment |
DESCRIPTION
20/30406234 DC
This standard 20/30406234 DC BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
- 31.080.99 Other semiconductor devices
- 31.080.30 Transistors