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Homepage>BS Standards>31 ELECTRONICS>31.190 Electronic component assemblies>22/30383603 DC BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices Part 4. Power cycling test method for die attach materials (near chip interconnection) applied to module type power electronic devices
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immediate downloadReleased: 2022-12-15
22/30383603 DC BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices Part 4. Power cycling test method for die attach materials (near chip interconnection) applied to module type power electronic devices

22/30383603 DC

BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices Part 4. Power cycling test method for die attach materials (near chip interconnection) applied to module type power electronic devices

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Standard number:22/30383603 DC
Pages:21
Released:2022-12-15
Status:Draft for Comment
DESCRIPTION

22/30383603 DC


This standard 22/30383603 DC BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices is classified in these ICS categories:
  • 31.190 Electronic component assemblies

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