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Homepage>BS Standards>01 GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION>01.040 Vocabularies>01.040.37 Image technology (Vocabularies)>24/30465997 DC Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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immediate downloadReleased: 2024-01-15
24/30465997 DC Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

24/30465997 DC

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

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Standard number:24/30465997 DC
Pages:34
Released:2024-01-15
Status:Draft for Comment
DESCRIPTION

24/30465997 DC


This standard 24/30465997 DC Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary is classified in these ICS categories:
  • 01.040.37 Image technology (Vocabularies)
  • 01.040.71 Chemical technology (Vocabularies)
  • 71.040.50 Physicochemical methods of analysis

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