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Homepage>BS Standards>37 IMAGE TECHNOLOGY>37.020 Optical equipment>24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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immediate downloadReleased: 2024-02-05
24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

24/30479444 DC

BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

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Standard number:24/30479444 DC
Pages:56
Released:2024-02-05
Status:Draft for Comment
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24/30479444 DC


This standard 24/30479444 DC BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
  • 37.020 Optical equipment
  • 71.040.50 Physicochemical methods of analysis
  • 71.040.50 Physicochemical methods of analysis
  • 37.020 Optical equipment

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