Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.50 Physicochemical methods of analysis>24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Sponsored link
immediate downloadReleased: 2024-06-07
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

24/30479937 DC

BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

Format
Availability
Price and currency
English Secure PDF
Immediate download
24.00 EUR
English Hardcopy
In stock
24.00 EUR
Standard number:24/30479937 DC
Pages:49
Released:2024-06-07
Status:Draft for Comment
DESCRIPTION

24/30479937 DC


This standard 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope is classified in these ICS categories:
  • 71.040.50 Physicochemical methods of analysis

Print