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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>24/30492188 DC Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages Part 6. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
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immediate downloadReleased: 2024-04-30
24/30492188 DC Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages Part 6. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

24/30492188 DC

Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages Part 6. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

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Standard number:24/30492188 DC
Pages:32
Released:2024-04-30
Status:Draft for Comment
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24/30492188 DC


This standard 24/30492188 DC Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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