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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
immediate downloadReleased: 2024-08-16
24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

24/30499009 DC

BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

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Standard number:24/30499009 DC
Pages:31
Released:2024-08-16
Status:Draft for Comment
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24/30499009 DC


This standard 24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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