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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
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immediate downloadReleased: 2024-09-13
24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS

24/30500239 DC

BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS

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Standard number:24/30500239 DC
Pages:15
Released:2024-09-13
Status:Draft for Comment
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24/30500239 DC


This standard 24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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