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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>24/30501110 DC BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method
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immediate downloadReleased: 2024-09-27
24/30501110 DC BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method

24/30501110 DC

BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity Part 8: Measurement of radiated immunity - IC stripline method

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Standard number:24/30501110 DC
Pages:25
Released:2024-09-27
Status:Draft for Comment
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24/30501110 DC


This standard 24/30501110 DC BS EN IEC 62132-8 Integrated circuits - Measurement of electromagnetic immunity is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics