Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
Sponsored link
immediate downloadReleased: 2024-11-22

24/30505492 DC

BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices

Format
Availability
Price and currency
English Secure PDF
Immediate download
24.20 EUR
English Hardcopy
In stock
24.20 EUR
Standard number:24/30505492 DC
Pages:20
Released:2024-11-22
Status:Draft for Comment
DESCRIPTION

24/30505492 DC


This standard 24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Print