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immediate downloadReleased: 1990-07-31
BS 7317-6:1990
Methods for analysis of high purity copper cathode Cu-CATH-1 Method for determination of phosphorus and silicon by spectrophotometry
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| Standard number: | BS 7317-6:1990 |
| Pages: | 10 |
| Released: | 1990-07-31 |
| ISBN: | 0 580 18465 X |
| Status: | Standard |
DESCRIPTION
BS 7317-6:1990
This standard BS 7317-6:1990 Methods for analysis of high purity copper cathode Cu-CATH-1 is classified in these ICS categories:
- 77.120.30 Copper and copper alloys
This Part of BS 7317 describes a method for the determination of the actual amounts of the impurity elements phosphorus and silicon present in high purity copper cathode (designated Cu-CATH-1), by spectrophotometry. It is applicable to concentrations of the elements not exceeding the following limits:
| phosphorus | 20 µg/g (0.0020 % m/m) maximum; |
| silicon | 25 µg/g (0.0025 % m/m) maximum. |
NOTE The titles of the publications referred to in this Part of BS 7317 are listed on the inside back cover.
Applies to low levels in high purity copper cathode specified in BS 6017.