PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Sponsored link
immediate downloadReleased: 1993-09-15
BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

BS EN 60444-2:1997

Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

Format
Availability
Price and currency
English Secure PDF
Immediate download
180.00 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
18.00 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
54.00 EUR
English Hardcopy
In stock
180.00 EUR
Standard number:BS EN 60444-2:1997
Pages:16
Released:1993-09-15
ISBN:0 580 22497 X
Status:Standard
DESCRIPTION

BS EN 60444-2:1997


This standard BS EN 60444-2:1997 Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices