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Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 60444-3:1997 Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C<sub>0</sub>
immediate downloadReleased: 1993-09-15
BS EN 60444-3:1997 Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C<sub>0</sub>

BS EN 60444-3:1997

Measurement of quartz crystal unit parameters Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C<sub>0</sub>

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Standard number:BS EN 60444-3:1997
Pages:20
Released:1993-09-15
ISBN:0 580 22498 8
Status:Standard
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BS EN 60444-3:1997


This standard BS EN 60444-3:1997 Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices

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