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Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 60444-6:2013 Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
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immediate downloadReleased: 2013-10-31
BS EN 60444-6:2013 Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)

BS EN 60444-6:2013

Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)

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Standard number:BS EN 60444-6:2013
Pages:24
Released:2013-10-31
ISBN:978 0 580 64890 8
Status:Standard
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BS EN 60444-6:2013


This standard BS EN 60444-6:2013 Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
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