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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods General
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immediate downloadReleased: 2003-07-07
BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods General

BS EN 60749-1:2003

Semiconductor devices. Mechanical and climatic test methods General

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Standard number:BS EN 60749-1:2003
Pages:12
Released:2003-07-07
ISBN:0 580 42198 8
Status:Standard
DESCRIPTION

BS EN 60749-1:2003


This standard BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
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