Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Sponsored link
immediate downloadReleased: 2004-06-24
BS EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

BS EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

Format
Availability
Price and currency
English Secure PDF
Immediate download
162.14 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
16.21 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
48.64 EUR
English Hardcopy
In stock
162.14 EUR
Standard number:BS EN 60749-16:2003
Pages:10
Released:2004-06-24
ISBN:0 580 42062 0
Status:Standard
DESCRIPTION

BS EN 60749-16:2003


This standard BS EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
Print