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immediate downloadReleased: 2011-06-30
BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
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| Standard number: | BS EN 60749-23:2004+A1:2011 |
| Pages: | 12 |
| Released: | 2011-06-30 |
| ISBN: | 978 0 580 68753 2 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-23:2004+A1:2011
This standard BS EN 60749-23:2004+A1:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as “burn-in”, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this standard.