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immediate downloadReleased: 2011-08-31
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
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| Standard number: | BS EN 60749-29:2011 |
| Pages: | 26 |
| Released: | 2011-08-31 |
| ISBN: | 978 0 580 69138 6 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-29:2011
This standard BS EN 60749-29:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.
This test is classified as destructive.
The purpose of this test is to establish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up.
This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.
The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2