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immediate downloadReleased: 2017-11-24
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
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| Standard number: | BS EN 60749-3:2017 |
| Pages: | 18 |
| Released: | 2017-11-24 |
| ISBN: | 978 0 580 94893 0 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-3:2017
This standard BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.