Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Sponsored link
immediate downloadReleased: 2017-11-28
BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Format
Availability
Price and currency
English Secure PDF
Immediate download
191.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
19.12 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
57.35 EUR
English Hardcopy
In stock
191.18 EUR
Standard number:BS EN 60749-4:2017
Pages:16
Released:2017-11-28
ISBN:978 0 580 94229 7
Status:Standard
DESCRIPTION

BS EN 60749-4:2017


This standard BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.


Print