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immediate downloadReleased: 2011-09-30
BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
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| Standard number: | BS EN 60749-7:2011 |
| Pages: | 16 |
| Released: | 2011-09-30 |
| ISBN: | 978 0 580 68752 5 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-7:2011
This standard BS EN 60749-7:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.