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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing
immediate downloadReleased: 2003-07-03
BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing

BS EN 60749-8:2003

Semiconductor devices. Mechanical and climatic test methods Sealing

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Standard number:BS EN 60749-8:2003
Pages:20
Released:2003-07-03
ISBN:0 580 42201 1
Status:Standard
DESCRIPTION

BS EN 60749-8:2003


This standard BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
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