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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 61967-5:2003 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method
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immediate downloadReleased: 2003-06-17
BS EN 61967-5:2003 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method

BS EN 61967-5:2003

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method

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Standard number:BS EN 61967-5:2003
Pages:28
Released:2003-06-17
ISBN:0 580 42058 2
Status:Standard
DESCRIPTION

BS EN 61967-5:2003


This standard BS EN 61967-5:2003 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
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