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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 62132-3:2007 Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method
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immediate downloadReleased: 2007-11-30
BS EN 62132-3:2007 Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method

BS EN 62132-3:2007

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Bulk current injection (BCI) method

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Standard number:BS EN 62132-3:2007
Pages:22
Released:2007-11-30
ISBN:978 0 580 53403 4
Status:Standard
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BS EN 62132-3:2007


This standard BS EN 62132-3:2007 Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.
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