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Homepage>BS Standards>17 METROLOGY AND MEASUREMENT. PHYSICAL PHENOMENA>17.220 Electricity. Magnetism. Electrical and magnetic measurements>17.220.20 Measurement of electrical and magnetic quantities>BS EN 62226-1:2005 Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating the current density and internal electric field induced in the human body General
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immediate downloadReleased: 2005-04-05
BS EN 62226-1:2005 Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating the current density and internal electric field induced in the human body General

BS EN 62226-1:2005

Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating the current density and internal electric field induced in the human body General

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Standard number:BS EN 62226-1:2005
Pages:16
Released:2005-04-05
ISBN:0 580 45698 6
Status:Standard
DESCRIPTION

BS EN 62226-1:2005


This standard BS EN 62226-1:2005 Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating the current density and internal electric field induced in the human body is classified in these ICS categories:
  • 17.220.20 Measurement of electrical and magnetic quantities
Provides means for demonstrating compliance with the basic restrictions on human exposure to low and intermediate frequency electric and magnetic fields specified in exposure standards or guidelines such as those produced by IEEE and ICNIRP. The object of IEC 62226 is - to propose a more realistic approach to the modelling of the human exposure to low frequency electric and magnetic fields, using a set of models of growing complexity for the field emission source, or the human body or both; - to propose standardised values for the electrical parameters of organs in human body: electrical conductivity and permittivity and their variation with the frequency. The present basic standard does not aim at replacing the definitions and procedures specified in exposure standards or guidelines, such as those produced by IEEE or ICNIRP, but aims at providing additional procedures with a view to allowing compliance assessment with these documents. The present basic standard provides means for demonstrating compliance with the basic restrictions without having to go to the sophisticated models. Nevertheless, when the exposure conditions are well characterized (such as in product standards, for example) and when results from such models are available, they can be used for demonstrating compliance with EMF standards or guidelines.