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immediate downloadReleased: 2006-09-29
BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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| Standard number: | BS EN 62373:2006 |
| Pages: | 16 |
| Released: | 2006-09-29 |
| ISBN: | 0 580 49255 9 |
| Status: | Standard |
DESCRIPTION
BS EN 62373:2006
This standard BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) is classified in these ICS categories:
- 31.080.30 Transistors