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immediate downloadReleased: 2010-07-31
BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
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| Standard number: | BS EN 62415:2010 |
| Pages: | 14 |
| Released: | 2010-07-31 |
| ISBN: | 978 0 580 61882 6 |
| Status: | Standard |
DESCRIPTION
BS EN 62415:2010
This standard BS EN 62415:2010 Semiconductor devices. Constant current electromigration test is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.