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immediate downloadReleased: 2010-07-31
BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
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| Standard number: | BS EN 62416:2010 |
| Pages: | 14 |
| Released: | 2010-07-31 |
| ISBN: | 978 0 580 58621 7 |
| Status: | Standard |
DESCRIPTION
BS EN 62416:2010
This standard BS EN 62416:2010 Semiconductor devices. Hot carrier test on MOS transistors is classified in these ICS categories:
- 31.080.30 Transistors
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.