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Homepage>BS Standards>31 ELECTRONICS>31.180 Printed circuits and boards>BS EN 62878-1-1:2015 Device embedded substrate Generic specification. Test methods
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immediate downloadReleased: 2015-07-31
BS EN 62878-1-1:2015 Device embedded substrate Generic specification. Test methods

BS EN 62878-1-1:2015

Device embedded substrate Generic specification. Test methods

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Standard number:BS EN 62878-1-1:2015
Pages:62
Released:2015-07-31
ISBN:978 0 580 82122 6
Status:Standard
DESCRIPTION

BS EN 62878-1-1:2015


This standard BS EN 62878-1-1:2015 Device embedded substrate is classified in these ICS categories:
  • 31.180 Printed circuits and boards
  • 31.190 Electronic component assemblies
IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
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