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Homepage>BS Standards>31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
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BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method

BS EN 62884-2:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method

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Standard number:BS EN 62884-2:2017
Pages:30
Released:2017-12-08
ISBN:978 0 580 95345 3
Status:Standard
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BS EN 62884-2:2017


This standard BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators is classified in these ICS categories:
  • 31.140 Piezoelectric devices

This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.