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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
immediate downloadReleased: 2018-04-18
BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

BS EN IEC 60749-12:2018

Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

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Standard number:BS EN IEC 60749-12:2018
Pages:12
Released:2018-04-18
ISBN:978 0 580 98682 6
Status:Standard
DESCRIPTION

BS EN IEC 60749-12:2018


This standard BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.


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