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immediate downloadReleased: 2018-04-18
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
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| Standard number: | BS EN IEC 60749-12:2018 |
| Pages: | 12 |
| Released: | 2018-04-18 |
| ISBN: | 978 0 580 98682 6 |
| Status: | Standard |
DESCRIPTION
BS EN IEC 60749-12:2018
This standard BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.