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immediate downloadReleased: 2019-05-15
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
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| Standard number: | BS EN IEC 60749-17:2019 |
| Pages: | 14 |
| Released: | 2019-05-15 |
| ISBN: | 978 0 539 00062 7 |
| Status: | Standard |
DESCRIPTION
BS EN IEC 60749-17:2019
This standard BS EN IEC 60749-17:2019 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).