BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
| Standard number: | BS EN IEC 60749-17:2019 |
| Pages: | 14 |
| Released: | 2019-05-15 |
| ISBN: | 978 0 539 00062 7 |
| Status: | Standard |
BS EN IEC 60749-17:2019: Semiconductor Devices - Mechanical and Climatic Test Methods for Neutron Irradiation
In the ever-evolving world of semiconductor technology, ensuring the reliability and durability of devices is paramount. The BS EN IEC 60749-17:2019 standard is an essential resource for professionals in the semiconductor industry, providing comprehensive guidelines for mechanical and climatic test methods, specifically focusing on neutron irradiation.
Overview of the Standard
This standard, released on May 15, 2019, is a critical document for anyone involved in the design, testing, and manufacturing of semiconductor devices. It outlines the procedures and methodologies for testing the effects of neutron irradiation on semiconductor devices, ensuring that they can withstand the harsh conditions they may encounter during their lifecycle.
Key Features
- Standard Number: BS EN IEC 60749-17:2019
- Pages: 14
- ISBN: 978 0 539 00062 7
- Status: Standard
Why Neutron Irradiation Testing is Important
Neutron irradiation testing is crucial for semiconductor devices as it simulates the conditions that these devices might face in environments with high levels of radiation, such as space or nuclear facilities. This type of testing helps in assessing the robustness and reliability of semiconductor components, ensuring they perform optimally under extreme conditions.
Benefits of Using This Standard
Adopting the BS EN IEC 60749-17:2019 standard offers numerous benefits:
- Enhanced Reliability: By following the guidelines, manufacturers can ensure their semiconductor devices are more reliable and durable.
- Compliance: Adhering to this standard helps companies meet international compliance requirements, facilitating easier market access.
- Quality Assurance: The standard provides a framework for consistent testing, leading to higher quality products.
- Risk Mitigation: Identifying potential failures before they occur reduces the risk of device malfunction in critical applications.
Who Should Use This Standard?
This standard is indispensable for a wide range of professionals in the semiconductor industry, including:
- Design Engineers
- Quality Assurance Specialists
- Testing and Validation Engineers
- Manufacturers of Semiconductor Devices
- Research and Development Teams
Comprehensive Testing Methodologies
The BS EN IEC 60749-17:2019 standard provides detailed methodologies for conducting neutron irradiation tests. These methodologies are designed to simulate real-world conditions as closely as possible, ensuring that the test results are both accurate and applicable to actual operating environments.
Detailed Procedures
The standard includes step-by-step procedures for setting up and conducting tests, as well as guidelines for interpreting the results. This ensures that all tests are conducted consistently and that the results are reliable and reproducible.
Conclusion
In conclusion, the BS EN IEC 60749-17:2019 standard is an invaluable tool for anyone involved in the semiconductor industry. By providing clear guidelines for neutron irradiation testing, it helps ensure that semiconductor devices are robust, reliable, and ready to meet the challenges of their operating environments. Whether you are a manufacturer, engineer, or quality assurance specialist, this standard is essential for maintaining the highest levels of product quality and performance.
Invest in the future of your semiconductor devices by incorporating the BS EN IEC 60749-17:2019 standard into your testing and quality assurance processes. With its comprehensive guidelines and detailed methodologies, you can be confident in the durability and reliability of your products.
BS EN IEC 60749-17:2019
This standard BS EN IEC 60749-17:2019 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).