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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN IEC 60749-20:2020 Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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BS EN IEC 60749-20:2020 Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

BS EN IEC 60749-20:2020

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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Standard number:BS EN IEC 60749-20:2020
Pages:32
Released:2020-10-14
ISBN:978 0 539 04584 0
Status:Standard
BS EN IEC 60749-20:2020 - Semiconductor Devices Standard

BS EN IEC 60749-20:2020: Semiconductor Devices - Mechanical and Climatic Test Methods

Discover the essential standard for ensuring the reliability and durability of semiconductor devices with the BS EN IEC 60749-20:2020. This comprehensive document provides detailed methodologies for testing the resistance of plastic encapsulated Surface-Mounted Devices (SMDs) to the combined effects of moisture and soldering heat. Released on October 14, 2020, this standard is a critical resource for professionals in the semiconductor industry.

Key Features of the Standard

  • Standard Number: BS EN IEC 60749-20:2020
  • Pages: 32
  • Release Date: 2020-10-14
  • ISBN: 978 0 539 04584 0
  • Status: Standard

Overview

The BS EN IEC 60749-20:2020 standard is an authoritative guide that outlines the mechanical and climatic test methods necessary for evaluating the performance of semiconductor devices. Specifically, it focuses on the resistance of plastic encapsulated SMDs to the dual challenges posed by moisture and soldering heat. This standard is indispensable for manufacturers, quality assurance professionals, and engineers who are committed to maintaining the highest levels of product reliability and performance.

Why This Standard is Important

In the fast-evolving world of electronics, ensuring the robustness of semiconductor devices is paramount. The BS EN IEC 60749-20:2020 standard provides a structured approach to testing, which helps in identifying potential vulnerabilities in SMDs. By adhering to this standard, companies can significantly reduce the risk of device failure, thereby enhancing product longevity and customer satisfaction.

Resistance to Moisture

Moisture can be a significant threat to the integrity of semiconductor devices. This standard provides detailed procedures for assessing how well plastic encapsulated SMDs can withstand moisture exposure. By following these guidelines, manufacturers can ensure that their products are capable of operating effectively in humid environments.

Resistance to Soldering Heat

Soldering is a critical process in the assembly of electronic components. However, the heat involved can potentially damage sensitive semiconductor devices. The BS EN IEC 60749-20:2020 standard includes specific test methods to evaluate the resilience of SMDs to soldering heat, ensuring that they can endure the thermal stresses encountered during manufacturing and assembly.

Comprehensive Testing Methodologies

This standard encompasses a range of testing methodologies designed to simulate real-world conditions. These tests are crucial for identifying weaknesses in semiconductor devices and for implementing improvements that enhance their performance and reliability. The methodologies outlined in the standard are based on extensive research and industry best practices, making them a reliable benchmark for quality assurance.

Who Should Use This Standard?

The BS EN IEC 60749-20:2020 standard is an invaluable resource for a wide range of professionals, including:

  • Semiconductor Manufacturers: To ensure that their products meet industry standards and are capable of withstanding environmental stresses.
  • Quality Assurance Teams: To implement rigorous testing protocols that guarantee product reliability.
  • Design Engineers: To incorporate robust design principles that enhance the durability of semiconductor devices.
  • Research and Development Teams: To innovate and improve existing products by understanding the limitations and capabilities of current technologies.

Benefits of Compliance

Adhering to the BS EN IEC 60749-20:2020 standard offers numerous benefits, including:

  • Enhanced Product Reliability: By following the standard's guidelines, manufacturers can produce semiconductor devices that are more reliable and less prone to failure.
  • Increased Customer Satisfaction: Reliable products lead to satisfied customers, which can enhance brand reputation and customer loyalty.
  • Competitive Advantage: Companies that comply with industry standards are often viewed as leaders in quality and innovation.
  • Reduced Risk of Product Recalls: Thorough testing reduces the likelihood of defects, minimizing the risk of costly recalls and repairs.

Conclusion

The BS EN IEC 60749-20:2020 standard is a vital tool for anyone involved in the design, manufacture, and testing of semiconductor devices. By providing a clear framework for assessing the resistance of SMDs to moisture and soldering heat, this standard helps ensure that products are robust, reliable, and ready to meet the demands of modern technology. Embrace this standard to enhance your product's performance and secure your place as a leader in the semiconductor industry.

DESCRIPTION

BS EN IEC 60749-20:2020


This standard BS EN IEC 60749-20:2020 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
IEC 60749-20:2020 is available as IEC 60749-20:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the following significant technical changes with respect to the previous edition: - incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition ); - inclusion of new Clause 3; - inclusion of explanatory notes.