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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN IEC 61967-8:2023 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
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BS EN IEC 61967-8:2023 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

BS EN IEC 61967-8:2023

Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

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Standard number:BS EN IEC 61967-8:2023
Pages:22
Released:2023-06-15
ISBN:978 0 539 21804 6
Status:Standard

BS EN IEC 61967-8:2023 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

Introducing the BS EN IEC 61967-8:2023, a comprehensive standard for the measurement of electromagnetic emissions and radiated emissions in integrated circuits. This standard is a must-have for professionals in the field of electronics and communications, providing a detailed guide on the IC stripline method. Released on June 15, 2023, this standard is the latest in the field, ensuring you are up-to-date with the most recent advancements and methodologies.

Key Features

The BS EN IEC 61967-8:2023 standard is a 22-page document, packed with valuable information and guidelines. It is meticulously organized and easy to navigate, making it a user-friendly resource for both beginners and seasoned professionals. The standard is recognized globally, ensuring its relevance and applicability in various contexts and regions.

One of the key features of this standard is its focus on the IC stripline method. This method is widely used in the measurement of radiated emissions, making this standard a crucial resource for those working in this area. The standard provides a detailed explanation of the method, along with practical examples and tips for implementation.

Why Choose BS EN IEC 61967-8:2023?

Choosing the BS EN IEC 61967-8:2023 standard means choosing a resource that is both comprehensive and current. The standard is regularly updated to reflect the latest advancements in the field, ensuring you are always at the forefront of your profession.

Furthermore, the standard is published by the British Standards Institution (BSI), a globally recognized body for standards. This means you can trust the quality and reliability of the information provided in the standard.

Specifications

  • Standard number: BS EN IEC 61967-8:2023
  • Pages: 22
  • Released: 2023-06-15
  • ISBN: 978 0 539 21804 6
  • Name: Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
  • Status: Standard

Conclusion

In conclusion, the BS EN IEC 61967-8:2023 standard is an invaluable resource for anyone involved in the measurement of electromagnetic and radiated emissions in integrated circuits. Its detailed guidelines, practical examples, and up-to-date information make it a must-have for professionals in the field. Don't miss out on this opportunity to stay ahead in your profession. Get your copy of the BS EN IEC 61967-8:2023 standard today!

DESCRIPTION

BS EN IEC 61967-8:2023


This standard BS EN IEC 61967-8:2023 Integrated circuits. Measurement of electromagnetic emissions is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.