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Homepage>BS Standards>17 METROLOGY AND MEASUREMENT. PHYSICAL PHENOMENA>17.220 Electricity. Magnetism. Electrical and magnetic measurements>17.220.99 Other standards related to electricity and magnetism>BS EN IEC 62836:2024 - TC Tracked Changes. Measurement of internal electric field in insulating materials. Pressure wave propagation method
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immediate downloadReleased: 2024-04-16
BS EN IEC 62836:2024 - TC Tracked Changes. Measurement of internal electric field in insulating materials. Pressure wave propagation method

BS EN IEC 62836:2024 - TC

Tracked Changes. Measurement of internal electric field in insulating materials. Pressure wave propagation method

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Standard number:BS EN IEC 62836:2024 - TC
Pages:111
Released:2024-04-16
ISBN:978 0 539 31475 5
Status:Tracked Changes
DESCRIPTION

BS EN IEC 62836:2024 - TC


This standard BS EN IEC 62836:2024 - TC Tracked Changes. Measurement of internal electric field in insulating materials. Pressure wave propagation method is classified in these ICS categories:
  • 29.035.01 Insulating materials in general
  • 17.220.99 Other standards related to electricity and magnetism
IEC 62836:2024 provides an efficient and reliable procedure to test the internal electric field in the insulating materials used for high-voltage applications, by using the pressure wave propagation (PWP) method. It is suitable for a planar and coaxial geometry sample with homogeneous insulating materials of thickness larger or equal to 0,5 mm and an electric field higher than 1 kV/mm, but it is also dependent on the thickness of the sample and the pressure wave generator. This first edition cancels and replaces IEC TS 62836 published in 2020. This edition includes the following significant technical changes with respect to IEC TS 62836: a) addition of Clause 12 for the measurement of space charge distribution in a planar sample; b) addition of Clause 13 for coaxial geometry samples; c) addition of Annex D with measurement examples for coaxial geometry samples; d) addition of a Bibliography; e) measurement examples for a planar sample have been moved from Clause 12 in IEC TS 62836 to Annex C.