BS EN IEC 63185:2021 - Measurement of the Complex Permittivity for Low-Loss Dielectric Substrates

Introducing the BS EN IEC 63185:2021, a comprehensive standard that provides a detailed methodology for measuring the complex permittivity of low-loss dielectric substrates using the balanced-type circular disk resonator method. This standard is an essential resource for professionals in the field of electronics and materials science, offering precise guidelines to ensure accurate and reliable measurements.

Key Features and Benefits

The BS EN IEC 63185:2021 standard is meticulously crafted to cater to the needs of engineers, researchers, and technicians who require precise measurement techniques for dielectric materials. Here are some of the standout features and benefits:

• Comprehensive Methodology: This standard provides a detailed procedure for measuring the complex permittivity, ensuring that users can achieve consistent and accurate results.
• Focused on Low-Loss Dielectric Substrates: Specifically designed for low-loss materials, this standard is ideal for applications where minimal energy loss is critical.
• Balanced-Type Circular Disk Resonator Method: Utilizes a sophisticated measurement technique that enhances the precision and reliability of the results.
• Internationally Recognized: As a part of the IEC standards, it is recognized globally, facilitating international collaboration and standardization.

Technical Specifications

The BS EN IEC 63185:2021 standard is a concise yet comprehensive document, spanning 20 pages of detailed instructions and guidelines. Released on January 27, 2021, it is the latest in the series of standards aimed at improving measurement techniques for dielectric materials.

Here are some technical details:

• Standard Number: BS EN IEC 63185:2021
• ISBN: 978 0 539 00058 0
• Status: Standard

Applications and Use Cases

The BS EN IEC 63185:2021 standard is invaluable in various applications, particularly in industries where dielectric materials play a crucial role. Some of the key applications include:

• Telecommunications: Ensuring the efficiency and reliability of components used in high-frequency communication systems.
• Electronics Manufacturing: Critical for the development and testing of electronic components that require precise dielectric properties.
• Research and Development: Aiding researchers in developing new materials with specific dielectric characteristics.
• Quality Assurance: Providing a benchmark for quality control processes in the production of dielectric materials.

Why Choose BS EN IEC 63185:2021?

Choosing the BS EN IEC 63185:2021 standard means opting for precision, reliability, and international recognition. This standard is not just a document; it is a tool that empowers professionals to achieve excellence in their work. By adhering to this standard, you ensure that your measurements are not only accurate but also consistent with global best practices.

Moreover, the balanced-type circular disk resonator method outlined in this standard is a cutting-edge technique that enhances the accuracy of permittivity measurements, making it a preferred choice for professionals who demand the highest standards in their work.

Conclusion

In the ever-evolving field of electronics and materials science, having access to the right standards is crucial. The BS EN IEC 63185:2021 provides a robust framework for measuring the complex permittivity of low-loss dielectric substrates, ensuring that you have the tools needed to achieve precise and reliable results.

Whether you are involved in telecommunications, electronics manufacturing, or research and development, this standard is an indispensable resource that will enhance your capabilities and ensure that your work meets the highest international standards.

BS EN IEC 63185:2021

This standard BS EN IEC 63185:2021 Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method is classified in these ICS categories:

• 33.120.30 RF connectors

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.