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Homepage>BS Standards>31 ELECTRONICS>31.260 Optoelectronics. Laser equipment>BS EN ISO 13696:2022 - TC Tracked Changes. Optics and photonics. Test method for total scattering by optical components
immediate downloadReleased: 2023-09-27
BS EN ISO 13696:2022 - TC Tracked Changes. Optics and photonics. Test method for total scattering by optical components

BS EN ISO 13696:2022 - TC

Tracked Changes. Optics and photonics. Test method for total scattering by optical components

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Standard number:BS EN ISO 13696:2022 - TC
Pages:97
Released:2023-09-27
ISBN:978 0 539 28721 9
Status:Tracked Changes
DESCRIPTION

BS EN ISO 13696:2022 - TC


This standard BS EN ISO 13696:2022 - TC Tracked Changes. Optics and photonics. Test method for total scattering by optical components is classified in these ICS categories:
  • 31.260 Optoelectronics. Laser equipment
  • 37.020 Optical equipment
This document specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering or backward scattering to the total scattering of an optical component. This document applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. Measurement wavelengths covered by this document range from the ultraviolet above 250 nm to the infrared spectral region below 15 µm. For measurements in the deep ultraviolet between 190 nm to 250 nm, specific methods are considered and are described. Generally, optical scattering is considered as neglectable for wavelengths above 15 µm.