BS EN ISO 25178-604:2025 - Geometrical Product Specifications (GPS)

Introducing the BS EN ISO 25178-604:2025, a comprehensive standard that sets the benchmark for geometrical product specifications, specifically focusing on surface texture and the areal design and characteristics of non-contact instruments using coherence scanning interferometry. This standard is an essential resource for professionals in the field of metrology, quality control, and manufacturing who are looking to ensure precision and accuracy in surface texture measurement.

Key Features of BS EN ISO 25178-604:2025

This standard is meticulously crafted to provide detailed guidelines and specifications for the design and characteristics of non-contact instruments. Here are some of the key features:

• Standard Number: BS EN ISO 25178-604:2025
• Pages: 32
• Release Date: February 28, 2025
• ISBN: 978 0 539 24351 2
• Status: Standard

Why Choose BS EN ISO 25178-604:2025?

The BS EN ISO 25178-604:2025 standard is indispensable for organizations aiming to maintain high standards of quality and precision in their products. Here’s why this standard is a must-have:

1. Precision and Accuracy

With the increasing demand for high-precision products, this standard provides the necessary guidelines to ensure that non-contact instruments deliver accurate and reliable measurements. The coherence scanning interferometry technique is renowned for its ability to measure surface texture with exceptional precision.

2. Comprehensive Guidelines

This 32-page document offers a thorough exploration of the design and characteristics of non-contact instruments, ensuring that users have access to all the information needed to implement and maintain these systems effectively.

3. Up-to-Date Standards

Released on February 28, 2025, this standard reflects the latest advancements and best practices in the field of surface texture measurement, ensuring that your organization remains at the forefront of technological innovation.

4. Industry Compliance

Adhering to the BS EN ISO 25178-604:2025 standard ensures compliance with international quality standards, which is crucial for businesses operating in global markets. This compliance not only enhances product quality but also boosts customer confidence and satisfaction.

Applications of BS EN ISO 25178-604:2025

The applications of this standard are vast and varied, making it a valuable asset across multiple industries:

• Manufacturing: Ensures that products meet stringent quality requirements by providing precise surface texture measurements.
• Automotive: Critical for the production of components that require high precision and surface quality.
• Aerospace: Essential for the development of parts that must withstand extreme conditions and require exact specifications.
• Medical Devices: Guarantees the production of medical instruments and devices with surfaces that meet rigorous safety and quality standards.

Conclusion

The BS EN ISO 25178-604:2025 standard is an invaluable resource for any organization committed to excellence in surface texture measurement. By providing detailed guidelines on the design and characteristics of non-contact instruments, this standard ensures that your products meet the highest levels of precision and quality. Stay ahead of the competition and ensure compliance with international standards by integrating this essential document into your quality control processes.

Invest in the future of your organization with the BS EN ISO 25178-604:2025 standard and experience the benefits of enhanced precision, compliance, and customer satisfaction.

BS EN ISO 25178-604:2025

This standard BS EN ISO 25178-604:2025 Geometrical product specifications (GPS). Surface texture: Areal is classified in these ICS categories:

• 17.040.20 Properties of surfaces
• 17.040.40 Geometrical Product Specification (GPS)

This document specifies the design and metrological characteristics of coherence scanning interferometry (CSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from surface topography data, the methods described in this document are also applicable to profiling measurements.