BS IEC 60747-10:1991

This standard BS IEC 60747-10:1991 Semiconductor devices is classified in these ICS categories:

• 31.200 Integrated circuits. Microelectronics
• 31.080.01 Semiconductor devices in general

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:

• measurement methods of electrical characteristics;

• climatic and mechanical tests;

• endurance tests.

NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.