BS IEC 60747-14-11:2021
Semiconductor devices Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
Standard number: | BS IEC 60747-14-11:2021 |
Pages: | 24 |
Released: | 2021-03-12 |
ISBN: | 978 0 580 98982 7 |
Status: | Standard |
BS IEC 60747-14-11:2021 Semiconductor Devices Semiconductor Sensors
Welcome to the future of semiconductor technology with the BS IEC 60747-14-11:2021 standard. This comprehensive document is a must-have for professionals and enthusiasts in the field of semiconductor devices, offering a detailed test method for surface acoustic wave-based integrated sensors. These sensors are pivotal in measuring ultraviolet, illumination, and temperature, making them indispensable in a variety of applications.
Key Features
- Standard Number: BS IEC 60747-14-11:2021
- Pages: 24
- Release Date: March 12, 2021
- ISBN: 978 0 580 98982 7
- Status: Standard
Overview
The BS IEC 60747-14-11:2021 standard is a pivotal document that outlines the test methods for semiconductor sensors based on surface acoustic wave (SAW) technology. These sensors are integral in accurately measuring environmental parameters such as ultraviolet light, illumination levels, and temperature. The standard provides a structured approach to testing, ensuring that these sensors meet the highest quality and performance benchmarks.
Applications
Surface acoustic wave-based integrated sensors are utilized in a wide range of applications, including:
- Environmental Monitoring: Accurately measure UV radiation and illumination levels to assess environmental conditions.
- Industrial Automation: Monitor temperature and light conditions to optimize manufacturing processes.
- Consumer Electronics: Enhance device functionality by integrating sensors that respond to environmental changes.
- Healthcare: Use in medical devices to monitor patient environments and ensure optimal conditions.
Benefits
Adopting the BS IEC 60747-14-11:2021 standard offers numerous benefits, including:
- Precision and Accuracy: Ensure that your sensors provide reliable and precise measurements.
- Quality Assurance: Adhere to international standards to guarantee the quality and performance of your products.
- Innovation: Stay at the forefront of technology by implementing cutting-edge sensor solutions.
- Versatility: Apply these sensors across various industries, enhancing their functionality and value.
Technical Insights
The document delves into the technical aspects of SAW-based sensors, providing insights into their operation and testing. It covers the principles of surface acoustic wave technology, the design and integration of sensors, and the methodologies for testing their performance under different conditions. This knowledge is crucial for engineers and developers looking to implement these sensors in their projects.
Why Choose BS IEC 60747-14-11:2021?
Choosing the BS IEC 60747-14-11:2021 standard means choosing a path of excellence and innovation. This standard is not just a guideline; it is a comprehensive resource that empowers you to harness the full potential of semiconductor sensors. Whether you are developing new products or enhancing existing ones, this standard provides the framework you need to succeed.
Conclusion
In a world where technology is constantly evolving, staying updated with the latest standards is crucial. The BS IEC 60747-14-11:2021 standard is your gateway to mastering the art of semiconductor sensors. With its detailed methodologies and comprehensive insights, it is an invaluable asset for anyone involved in the design, development, and application of these advanced sensors.
Embrace the future of semiconductor technology with the BS IEC 60747-14-11:2021 standard and ensure your projects are equipped with the most reliable and efficient sensor solutions available.
BS IEC 60747-14-11:2021
This standard BS IEC 60747-14-11:2021 Semiconductor devices is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60747 defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wavebased semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.