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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS IEC 60747-18-1:2019 Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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immediate downloadReleased: 2019-06-07
BS IEC 60747-18-1:2019 Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

BS IEC 60747-18-1:2019

Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors

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Standard number:BS IEC 60747-18-1:2019
Pages:30
Released:2019-06-07
ISBN:978 0 580 95779 6
Status:Standard
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BS IEC 60747-18-1:2019


This standard BS IEC 60747-18-1:2019 Semiconductor devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.


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