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Homepage>BS Standards>29 ELECTRICAL ENGINEERING>29.045 Semiconducting materials>BS IEC 62899-503-3:2021 Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
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BS IEC 62899-503-3:2021 Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

BS IEC 62899-503-3:2021

Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

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Standard number:BS IEC 62899-503-3:2021
Pages:16
Released:2021-09-08
ISBN:978 0 539 04325 9
Status:Standard
BS IEC 62899-503-3:2021 Printed electronics Quality assessment

BS IEC 62899-503-3:2021 Printed Electronics Quality Assessment

Measuring Method of Contact Resistance for the Printed Thin Film Transistor - Transfer Length Method

Discover the latest standard in printed electronics quality assessment with the BS IEC 62899-503-3:2021. This comprehensive document provides a detailed methodology for measuring the contact resistance of printed thin film transistors using the transfer length method. Released on September 8, 2021, this standard is essential for professionals in the field of printed electronics who are looking to ensure the highest quality and performance of their products.

Key Features and Benefits

  • Standard Number: BS IEC 62899-503-3:2021
  • Pages: 16
  • Release Date: 2021-09-08
  • ISBN: 978 0 539 04325 9
  • Status: Standard

Why Choose BS IEC 62899-503-3:2021?

The BS IEC 62899-503-3:2021 standard is meticulously crafted to provide a reliable and accurate method for assessing the quality of printed thin film transistors. By following the guidelines and procedures outlined in this document, you can ensure that your printed electronics meet the highest standards of performance and reliability.

Comprehensive Quality Assessment

This standard offers a thorough approach to quality assessment, focusing on the critical aspect of contact resistance in printed thin film transistors. The transfer length method described in this document is a proven technique that provides precise and repeatable measurements, ensuring that your products perform consistently and reliably.

Up-to-Date and Relevant

Released in September 2021, the BS IEC 62899-503-3:2021 standard reflects the latest advancements and best practices in the field of printed electronics. By adhering to this standard, you can stay ahead of the curve and ensure that your products are in line with the most current industry requirements.

Easy to Understand and Implement

With 16 pages of clear and concise information, the BS IEC 62899-503-3:2021 standard is designed to be user-friendly and easy to implement. Whether you are a seasoned professional or new to the field of printed electronics, this document provides all the information you need to accurately measure contact resistance and ensure the quality of your products.

Who Should Use This Standard?

The BS IEC 62899-503-3:2021 standard is ideal for a wide range of professionals in the printed electronics industry, including:

  • Quality assurance engineers
  • Product development teams
  • Research and development scientists
  • Manufacturing engineers
  • Technical managers

Ensure the Highest Quality for Your Printed Electronics

In the rapidly evolving field of printed electronics, maintaining high quality and performance standards is crucial. The BS IEC 62899-503-3:2021 standard provides a reliable and effective method for measuring contact resistance, helping you to ensure that your products meet the highest standards of quality and reliability.

Stay Competitive

By implementing the guidelines and procedures outlined in this standard, you can enhance the quality of your printed electronics and stay competitive in the market. High-quality products not only meet customer expectations but also help to build a strong reputation for your brand.

Improve Product Performance

Accurate measurement of contact resistance is essential for optimizing the performance of printed thin film transistors. The transfer length method described in this standard provides precise and repeatable results, allowing you to fine-tune your products for maximum performance.

Reduce Defects and Failures

By following the BS IEC 62899-503-3:2021 standard, you can identify and address potential issues related to contact resistance early in the development process. This proactive approach helps to reduce defects and failures, ensuring that your products are reliable and durable.

Conclusion

The BS IEC 62899-503-3:2021 standard is an invaluable resource for anyone involved in the design, development, and manufacturing of printed electronics. With its clear guidelines and proven methodology, this standard provides a reliable and effective way to measure contact resistance and ensure the highest quality for your products.

Invest in the BS IEC 62899-503-3:2021 standard today and take the first step towards achieving excellence in printed electronics quality assessment.

DESCRIPTION

BS IEC 62899-503-3:2021


This standard BS IEC 62899-503-3:2021 Printed electronics is classified in these ICS categories:
  • 31.080.30 Transistors
  • 29.045 Semiconducting materials
  • 29.220.10 Primary cells and batteries
  • 29.220.30 Alkaline secondary cells and batteries
  • 29.220.99 Other cells and batteries
  • 91.120.10 Thermal insulation of buildings
  • 91.140.10 Central heating systems

This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.