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immediate downloadReleased: 2013-01-31
BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
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Standard number: | BS ISO 11505:2012 |
Pages: | 42 |
Released: | 2013-01-31 |
ISBN: | 978 0 580 77085 2 |
Status: | Standard |
DESCRIPTION
BS ISO 11505:2012
This standard BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry is classified in these ICS categories:
- 71.040.40 Chemical analysis
This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.