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immediate downloadReleased: 2013-04-30
BS ISO 11938:2012
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
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Standard number: | BS ISO 11938:2012 |
Pages: | 22 |
Released: | 2013-04-30 |
ISBN: | 978 0 580 63714 8 |
Status: | Standard |
DESCRIPTION
BS ISO 11938:2012
This standard BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy is classified in these ICS categories:
- 71.040.50 Physicochemical methods of analysis
This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.