PRICES include / exclude VAT
Homepage>BS Standards>71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis>BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Sponsored link
immediate downloadReleased: 2014-08-31
BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

BS ISO 13095:2014

Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Format
Availability
Price and currency
English Secure PDF
Immediate download
312.18 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
31.22 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
93.65 EUR
English Hardcopy
In stock
312.18 EUR
Standard number:BS ISO 13095:2014
Pages:36
Released:2014-08-31
ISBN:978 0 580 67752 6
Status:Standard
DESCRIPTION

BS ISO 13095:2014


This standard BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement is classified in these ICS categories:
  • 71.040.40 Chemical analysis

This International Standard specifies two methods for characterizing the shape of an AFM probe tip, specifically the shank and approximate tip profiles. These methods project the profile of an AFM probe tip onto a given plane, and the characteristics of the probe shank are also projected onto that plane under defined operating conditions. The latter indicates the usefulness of a given probe for depth measurements in narrow trenches and similar profiles. This International Standard is applicable to the probes with radii greater than 5u0, where u0 is the uncertainty of the width of the ridge structure in the reference sample used to characterize the probe.