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immediate downloadReleased: 2014-05-31
BS ISO 15625:2014
Silk. Electronic test method for defects and evenness of raw silk
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| Standard number: | BS ISO 15625:2014 |
| Pages: | 26 |
| Released: | 2014-05-31 |
| ISBN: | 978 0 580 71673 7 |
| Status: | Standard |
DESCRIPTION
BS ISO 15625:2014
This standard BS ISO 15625:2014 Silk. Electronic test method for defects and evenness of raw silk is classified in these ICS categories:
- 59.080.01 Textiles in general
This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.