PRICES include / exclude VAT
Sponsored link
immediate downloadReleased: 2010-09-30
BS ISO 17331:2004+A1:2010
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Format
Availability
Price and currency
English Secure PDF
Immediate download
266.20 EUR
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
26.62 EUR
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
79.86 EUR
English Hardcopy
In stock
266.20 EUR
Standard number: | BS ISO 17331:2004+A1:2010 |
Pages: | 28 |
Released: | 2010-09-30 |
ISBN: | 978 0 580 64479 5 |
Status: | Standard |
DESCRIPTION
BS ISO 17331:2004+A1:2010
This standard BS ISO 17331:2004+A1:2010 Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy is classified in these ICS categories:
- 71.040.40 Chemical analysis